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Artificial Intelligence with Open and Scaled Data Sharing in Semiconductor Manufacturing

Artificial intelligence is advancing rapidly, but its full economic potential depends on something far less visible: trustworthy measurement. This report explores how accurate benchmarks, testing methods, and evaluation frameworks shape innovation, reduce risk, and strengthen market confidence in AI systems. By analyzing the economic value created when AI performance can be reliably measured—such as improved safety, efficiency, and interoperability—it highlights why measurement science is foundational to responsible deployment. The framework also identifies gaps where better measurement tools could accelerate U.S. competitiveness and support safer, more effective AI adoption across sectors.

  • Author(s):
  • Sthitie Bom
  • Said Jahanmir
  • Don Ufford
  • Jim Davis
  • Bruce Kramer
  • Gregory W. Vogl
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Artificial Intelligence with Open and Scaled Data Sharing in Semiconductor Manufacturing
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  • White Paper
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Website:Visit Publisher Website
Publisher:National Institute of Standards and Technology (NIST)
Published:November 1, 2025
License:Public Domain

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